| An expression connecting the fourth central moment or an X -ray
diffraction line profile with the particle size and stacking disorders
of the type ortayerdisplacement In the specimen studied, has
been derived on the supposition that the line broadening Is due to
particle size as well as stacking disorders of the above type. It has
been shown that from a single reflection, the defect parameter
can be easily calculated and the method can be utilised as widely
as the method of second moment (I.e. variance) in the study or
disorders In layer silicate clay minerals. |
