| On the Impedance Measurement of High Resistivity
Materials by Using a Parallel Resistor in
Two Probe Arrangement |
Ritu Mishra1, Pramod Chaitanya1, Alok Shukla*, Lakshman Pandey1,
O. P. Thakur2, Om Parkash3 and Devendra Kumar3
pages : 261-264
DOI : 10.1080/0371750X.2013.851624 |
| Abstract |
| Impedance spectroscopy is now an established technique for the study of charge transfer/polarization processes
occurring locally as well as at interfaces in various types of material such as polycrystalline ceramics, polymers,
composites, ionic conductors, etc. This involves measurement of impedance and various related quantities such
as admittance, modulus, permittivity and permeability. The route of analysis of the experimental results is through
suitable modelling considered to be adequate for representing the processes. When the resistivity of the material
is high, the overall impedance attains very large values falling beyond the measurement range of impedance
meters usually available, and the low frequency intercepts in complex impedance plots are not seen. A clever
technique, first proposed in our laboratory and later followed elsewhere, is to perform the measurement with a
good quality high resistance in parallel to the system. In this paper a detailed analysis of various impedance
functions is presented along with the related plots as function of ratios of externally connected resistance and the
internal system resistance. As an example, experimental results obtained with SrO.TiO2-2SiO2.B2O3-CoO electronic
ceramics are given for demonstrating the technique. |
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