| Optical Dispersion in ZrO2-SiO2 Composite Thin Films
Prepared at Different Oxygen Partial Pressures |
S. Jena*, R. B. Tokas, S. Thakur and N. K. Sahoo
Pages 10-12
DOI:10.1080/0371750X.2013.794035 |
| Abstract |
| Mixed composite materials are highly useful for fabrication of interference based precision multilayer optical
devices because of their tunabile refractive imdex, tunable optical band gap and low optical losses with improved
laser damage resistance. In the present study, ZrO2-SiO2 (90:10) mixed composite thin films have been prepared by
electron-beam co-deposition at different oxygen partial pressures and the effect of oxygen pressure on the optical
properties (refractive index, extinction co-efficient, band gap, etc) of such films have been investigated. The optical
constants of the films have been derived by the inverse synthesis of transmission spectra obtained from
spectrophotometric measurements.
[Keywords: ZrO2-SiO2, Electron-beam evaporation, Oxygen partial pressure, Refractive index, Band gap] |
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