| Investigation of the Structural, Morphological, Dielectric,
and Ferroelectric Properties of BiNi0.5Ti0.5O3 |
PC Lalngilneia,a
Sushil Joshi,a
Alok Shukla,a,*
Nitin Kumara
and Ram Naresh Prasad Choudharyb
Pages : 151-160
DOI: 10.1080/0371750X.2025.2509494 |
| Abstract |
| The present study involves the synthesis and characterization of BiNi0.5Ti0.5O3
compound using a conventional solid-state reaction technique. The X-ray diffraction
(XRD) method was used to confirm the structural information, including phase purity,
crystallinity, and lattice parameters of the synthesized compound. The scanning
electron microscope (SEM) image reveals the presence of grains evenly spread
throughout the sample’s surface with varying sizes and an average size of 1-2 m. An
energy-dispersive X-ray (EDX) investigation reveals the presence of all necessary
components in the sample, with their corresponding atomic ratios. This observation
confirms that the sample is polycrystalline, as evidenced by the distinct grain
boundaries and uniform distribution of grains observed in the microstructure.
Dielectric/electrical investigations have been conducted across various temperatures
and frequencies. The impedance spectra validate the existence of a negative
temperature coefficient of resistance (NTCR) behaviour and the influence of grain
and grain boundary on the compound. The electrical conductivity phenomenon was
described by Jonscher’s Power law. The P-E response indicates that the present
compound has ferroelectric properties. The current investigation yields efficient and
interesting findings that may be further used in various electronic devices.
[Keywords: Solid-state reaction, XRD, SEM, Dielectric, Ferroelectric] |
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